|
With their strong background
in DFT and functional test pattern generation,
Wipro’s team of engineers firstly automated
the test flow for making the patterns Tester-friendly
and improved the test program to control yield
loss at probe testing, eliminating genuinely good
parts being rejected. The team also handled silicon
testing till production maturity level and ported
silicon test program to a more cost effective
ATE.
Role of Wipro engineers
in silicon validation:
 |
Generation
of test vectors for functional as well as
stuck at fault testing inclusive of Icc measurement,
memory testing and characterization vectors. |
|
Automation of existing
test flow of ATE |
|
Generation of test program
with automation process successfully |
|
Development of production
level test program for silicon and handoff
for probe |
|
Execution of latch up test
and life cycle test. |
|
Generation of silicon test
audit report |
|
Porting of production level
qualified silicon test program from high end
to low end ATE |
|
On line support in analyzing
silicon failure |
Key highlights of the project
|
Highly robust
Test vectors with >95% first pass, reduction
in the test cycle time. This helped the client
to ship parts for development work with high
qualification level. |
|
Automation of test flow
reduced the test program generation time from
over ten days to as low as one day. It also
controlled errors that creep into the test
program due to manual integration of test
flow files. |
|
Documented test flow automation,
characterization process. This helped the
client’s product engineers to understand
the process. |
|
